A Measurement Technique for Verifying the Match Condition of Assembled RFID Tags

Sung-Lin Chen, Ken-Huang Lin, Raj Mittra. A Measurement Technique for Verifying the Match Condition of Assembled RFID Tags. IEEE T. Instrumentation and Measurement, 59(8):2123-2133, 2010. [doi]

Authors

Sung-Lin Chen

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Ken-Huang Lin

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Raj Mittra

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