Single-fault fault collapsing analysis in sequential logic circuits - researchr publication authors

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Jwu E. Chen, Chung-Len Lee, Wen-Zen Shen. Single-fault fault collapsing analysis in sequential logic circuits. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 809-814, IEEE Computer Society, 1990. [doi]

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