Robust dislocation defects region segmentation for polysilicon wafer image - researchr publication authors

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Haiyong Chen, Jiali Liu, Shuang Wang, Kun Liu, Peng Yang. Robust dislocation defects region segmentation for polysilicon wafer image. In Xiandong Ma, editor, 24th International Conference on Automation and Computing, ICAC 2018, Newcastle upon Tyne, United Kingdom, September 6-7, 2018. pages 1-6, IEEE, 2018. [doi]

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