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Effect of Excitation-Measurement Pattern of Planar Electrode Array on Detecting Crush Injuries

Fan Chen, Duo Li, Yanbin Xu, Shuaifu Zhang, Qi Lv, Haojun Fan, Feng Dong. Effect of Excitation-Measurement Pattern of Planar Electrode Array on Detecting Crush Injuries. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2024, Glasgow, United Kingdom, May 20-23, 2024. pages 1-6, IEEE, 2024. [doi]

Authors

Fan Chen

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Duo Li

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Yanbin Xu

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Shuaifu Zhang

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Qi Lv

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Haojun Fan

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Feng Dong

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