Yung-Yuan Chen, Kuen-Long Leu, Chao-Sung Yeh. Fault-Tolerant VLIW Processor Design and Error Coverage Analysis. In Edwin Hsing-Mean Sha, Sung-Kook Han, Cheng-Zhong Xu, Moon-hae Kim, Laurence Tianruo Yang, Bin Xiao, editors, Embedded and Ubiquitous Computing, International Conference, EUC 2006, Seoul, Korea, August 1-4, 2006, Proceedings. Volume 4096 of Lecture Notes in Computer Science, pages 754-765, Springer, 2006. [doi]
@inproceedings{ChenLY06:3,
title = {Fault-Tolerant VLIW Processor Design and Error Coverage Analysis},
author = {Yung-Yuan Chen and Kuen-Long Leu and Chao-Sung Yeh},
year = {2006},
doi = {10.1007/11802167_76},
url = {http://dx.doi.org/10.1007/11802167_76},
tags = {analysis, design, coverage},
researchr = {https://researchr.org/publication/ChenLY06%3A3},
cites = {0},
citedby = {0},
pages = {754-765},
booktitle = {Embedded and Ubiquitous Computing, International Conference, EUC 2006, Seoul, Korea, August 1-4, 2006, Proceedings},
editor = {Edwin Hsing-Mean Sha and Sung-Kook Han and Cheng-Zhong Xu and Moon-hae Kim and Laurence Tianruo Yang and Bin Xiao},
volume = {4096},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-36679-2},
}