An Enhanced-Sensitivity Tangential Electric Field Probe With Tunable Resonant Frequency

Zhi-Peng Chen, Zhen-Guo Liu, Shang Zhang, Meng-Zi Li, Wei Bing Lu. An Enhanced-Sensitivity Tangential Electric Field Probe With Tunable Resonant Frequency. IEEE T. Instrumentation and Measurement, 72:1-12, 2023. [doi]

@article{ChenLZLL23,
  title = {An Enhanced-Sensitivity Tangential Electric Field Probe With Tunable Resonant Frequency},
  author = {Zhi-Peng Chen and Zhen-Guo Liu and Shang Zhang and Meng-Zi Li and Wei Bing Lu},
  year = {2023},
  doi = {10.1109/TIM.2023.3276025},
  url = {https://doi.org/10.1109/TIM.2023.3276025},
  researchr = {https://researchr.org/publication/ChenLZLL23},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {72},
  pages = {1-12},
}