Fen Chen, Erik McCullen, Cathryn Christiansen, Michael A. Shinosky, Roger Dufresne, Prakash Periasamy, Rick Kontra, Carole Graas, Gary StOnge. Diagnostic electromigration reliability evaluation with a local sensing structure. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]
@inproceedings{ChenMCSDPKGS15,
title = {Diagnostic electromigration reliability evaluation with a local sensing structure},
author = {Fen Chen and Erik McCullen and Cathryn Christiansen and Michael A. Shinosky and Roger Dufresne and Prakash Periasamy and Rick Kontra and Carole Graas and Gary StOnge},
year = {2015},
doi = {10.1109/IRPS.2015.7112683},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112683},
researchr = {https://researchr.org/publication/ChenMCSDPKGS15},
cites = {0},
citedby = {0},
pages = {2},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}