Static probabilistic timing analysis with a permanent fault detection mechanism - researchr publication authors

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Chao Chen, Jacopo Panerati, Imane Hafnaoui, Giovanni Beltrame. Static probabilistic timing analysis with a permanent fault detection mechanism. In 12th IEEE International Symposium on Industrial Embedded Systems, SIES 2017, Toulouse, France, June 14-16, 2017. pages 1-10, IEEE, 2017. [doi]

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