Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes

X. Y. Chen, A. Pedersen, A. D. van Rheenen. Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes. Microelectronics Reliability, 41(1):105-110, 2001. [doi]

Authors

X. Y. Chen

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A. Pedersen

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A. D. van Rheenen

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