A size sensitivity method for interactive MOS circuit sizing

Jiajun Chen, Guoyong Shi, Andy Tai, Frank Lee. A size sensitivity method for interactive MOS circuit sizing. In 10th IEEE International NEWCAS Conference, Montreal, QC, Canada, June 17-20, 2012. pages 169-172, IEEE, 2012. [doi]

@inproceedings{ChenSTL12,
  title = {A size sensitivity method for interactive MOS circuit sizing},
  author = {Jiajun Chen and Guoyong Shi and Andy Tai and Frank Lee},
  year = {2012},
  doi = {10.1109/NEWCAS.2012.6328983},
  url = {https://doi.org/10.1109/NEWCAS.2012.6328983},
  researchr = {https://researchr.org/publication/ChenSTL12},
  cites = {0},
  citedby = {0},
  pages = {169-172},
  booktitle = {10th IEEE International NEWCAS Conference, Montreal, QC, Canada, June 17-20, 2012},
  publisher = {IEEE},
  isbn = {978-1-4673-0857-1},
}