Sirui Chen, Shuo Shan, Liping Xie, Haikun Wei, Jinxia Zhang. A Deep Two-Stage Scheme for Polycrystalline Micro-Crack Detection. In Wenbing Zhao 0001, editor, PRIS 2020: International Conference on Pattern Recognition and Intelligent Systems, Virtual Event / Athens, Greece, July, 2020. ACM, 2020. [doi]
@inproceedings{ChenSXWZ20,
title = {A Deep Two-Stage Scheme for Polycrystalline Micro-Crack Detection},
author = {Sirui Chen and Shuo Shan and Liping Xie and Haikun Wei and Jinxia Zhang},
year = {2020},
url = {https://dl.acm.org/doi/10.1145/3415048.3416119},
researchr = {https://researchr.org/publication/ChenSXWZ20},
cites = {0},
citedby = {0},
booktitle = {PRIS 2020: International Conference on Pattern Recognition and Intelligent Systems, Virtual Event / Athens, Greece, July, 2020},
editor = {Wenbing Zhao 0001},
publisher = {ACM},
isbn = {978-1-4503-8769-9},
}