Ssu-Han Chen, Chia-Chun Tsai. SMD LED chips defect detection using a YOLOv3-dense model. AI in Engineering, 47:101255, 2021. [doi]
@article{ChenT21-4,
title = {SMD LED chips defect detection using a YOLOv3-dense model},
author = {Ssu-Han Chen and Chia-Chun Tsai},
year = {2021},
doi = {10.1016/j.aei.2021.101255},
url = {https://doi.org/10.1016/j.aei.2021.101255},
researchr = {https://researchr.org/publication/ChenT21-4},
cites = {0},
citedby = {0},
journal = {AI in Engineering},
volume = {47},
pages = {101255},
}