Wei-Chou Chen, Shian-Shyong Tseng, Ching-Yao Wang. A novel manufacturing defect detection method using association rule mining techniques. Expert Syst. Appl., 29(4):807-815, 2005. [doi]
@article{ChenTW05,
title = {A novel manufacturing defect detection method using association rule mining techniques},
author = {Wei-Chou Chen and Shian-Shyong Tseng and Ching-Yao Wang},
year = {2005},
doi = {10.1016/j.eswa.2005.06.004},
url = {http://dx.doi.org/10.1016/j.eswa.2005.06.004},
tags = {rule-based, rules},
researchr = {https://researchr.org/publication/ChenTW05},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {29},
number = {4},
pages = {807-815},
}