Shilin Chen, Xingwang Wang, Xiaohui Wei 0002, Yafeng Sun, Kun Yang 0001. Deeply understanding features to achieve efficient remote sensing image classification. Expert Syst. Appl., 295:128743, 2026. [doi]
@article{ChenWWSY26,
title = {Deeply understanding features to achieve efficient remote sensing image classification},
author = {Shilin Chen and Xingwang Wang and Xiaohui Wei 0002 and Yafeng Sun and Kun Yang 0001},
year = {2026},
doi = {10.1016/j.eswa.2025.128743},
url = {https://doi.org/10.1016/j.eswa.2025.128743},
researchr = {https://researchr.org/publication/ChenWWSY26},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {295},
pages = {128743},
}