Modeling the High-Frequency Degradation of Phase/Frequency Detectors

Roger Yubtzuan Chen, Zong-Yi Yang. Modeling the High-Frequency Degradation of Phase/Frequency Detectors. IEEE Trans. on Circuits and Systems, 57-II(5):394-398, 2010. [doi]

@article{ChenY10a-2,
  title = {Modeling the High-Frequency Degradation of Phase/Frequency Detectors},
  author = {Roger Yubtzuan Chen and Zong-Yi Yang},
  year = {2010},
  doi = {10.1109/TCSII.2010.2047327},
  url = {http://dx.doi.org/10.1109/TCSII.2010.2047327},
  researchr = {https://researchr.org/publication/ChenY10a-2},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on Circuits and Systems},
  volume = {57-II},
  number = {5},
  pages = {394-398},
}