Kai Chen 0020, Taihe Yi, Qi Lv. LightQNet: Lightweight Deep Face Quality Assessment for Risk-Controlled Face Recognition. IEEE Signal Process. Lett., 28:1878-1882, 2021. [doi]
@article{ChenYL21-6,
title = {LightQNet: Lightweight Deep Face Quality Assessment for Risk-Controlled Face Recognition},
author = {Kai Chen 0020 and Taihe Yi and Qi Lv},
year = {2021},
doi = {10.1109/LSP.2021.3109781},
url = {https://doi.org/10.1109/LSP.2021.3109781},
researchr = {https://researchr.org/publication/ChenYL21-6},
cites = {0},
citedby = {0},
journal = {IEEE Signal Process. Lett.},
volume = {28},
pages = {1878-1882},
}