Side-channel Attacks on Memristive Circuits Under External Disturbances

Li-Wei Chen, Xianyue Zhao, Ziang Chen, Nan Du, Ilia Polian. Side-channel Attacks on Memristive Circuits Under External Disturbances. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]

Authors

Li-Wei Chen

This author has not been identified. Look up 'Li-Wei Chen' in Google

Xianyue Zhao

This author has not been identified. Look up 'Xianyue Zhao' in Google

Ziang Chen

This author has not been identified. Look up 'Ziang Chen' in Google

Nan Du

This author has not been identified. Look up 'Nan Du' in Google

Ilia Polian

This author has not been identified. Look up 'Ilia Polian' in Google