Chengjun Chen, Chunlin Zhang, Changzhi Li, Jun Hong 0002. Assembly Monitoring Using Semantic Segmentation Network Based on Multiscale Feature Maps and Trainable Guided Filter. IEEE T. Instrumentation and Measurement, 71:1-11, 2022. [doi]
@article{ChenZLH22-1,
title = {Assembly Monitoring Using Semantic Segmentation Network Based on Multiscale Feature Maps and Trainable Guided Filter},
author = {Chengjun Chen and Chunlin Zhang and Changzhi Li and Jun Hong 0002},
year = {2022},
doi = {10.1109/TIM.2022.3204322},
url = {https://doi.org/10.1109/TIM.2022.3204322},
researchr = {https://researchr.org/publication/ChenZLH22-1},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {71},
pages = {1-11},
}