Ching-Hwa Cheng, Chen-I Chung. Built-in fine resolution clipping with calibration technique for high-speed testing by using wireless testers. In IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2011), Hong Kong, China, June 27-30, 2011. pages 81-84, IEEE, 2011. [doi]
@inproceedings{ChengC11-1,
title = {Built-in fine resolution clipping with calibration technique for high-speed testing by using wireless testers},
author = {Ching-Hwa Cheng and Chen-I Chung},
year = {2011},
doi = {10.1109/DSNW.2011.5958840},
url = {http://doi.ieeecomputersociety.org/10.1109/DSNW.2011.5958840},
researchr = {https://researchr.org/publication/ChengC11-1},
cites = {0},
citedby = {0},
pages = {81-84},
booktitle = {IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W 2011), Hong Kong, China, June 27-30, 2011},
publisher = {IEEE},
isbn = {978-1-4577-0374-4},
}