Label Ranking Methods based on the Plackett-Luce Model

Weiwei Cheng, Krzysztof Dembczynski, Eyke Hüllermeier. Label Ranking Methods based on the Plackett-Luce Model. In Johannes Fürnkranz, Thorsten Joachims, editors, Proceedings of the 27th International Conference on Machine Learning (ICML-10), June 21-24, 2010, Haifa, Israel. pages 215-222, Omnipress, 2010. [doi]

Authors

Weiwei Cheng

This author has not been identified. Look up 'Weiwei Cheng' in Google

Krzysztof Dembczynski

This author has not been identified. Look up 'Krzysztof Dembczynski' in Google

Eyke Hüllermeier

This author has not been identified. Look up 'Eyke Hüllermeier' in Google