Weiwei Cheng, Eyke Hüllermeier. Combining Instance-Based Learning and Logistic Regression for Multilabel Classification. In Wray L. Buntine, Marko Grobelnik, Dunja Mladenic, John Shawe-Taylor, editors, Machine Learning and Knowledge Discovery in Databases, European Conference, ECML PKDD 2009, Bled, Slovenia, September 7-11, 2009, Proceedings, Part I. Volume 5781 of Lecture Notes in Computer Science, pages 6, Springer, 2009. [doi]
@inproceedings{ChengH09-3, title = {Combining Instance-Based Learning and Logistic Regression for Multilabel Classification}, author = {Weiwei Cheng and Eyke Hüllermeier}, year = {2009}, doi = {10.1007/978-3-642-04180-8_6}, url = {http://dx.doi.org/10.1007/978-3-642-04180-8_6}, tags = {rule-based, classification}, researchr = {https://researchr.org/publication/ChengH09-3}, cites = {0}, citedby = {0}, pages = {6}, booktitle = {Machine Learning and Knowledge Discovery in Databases, European Conference, ECML PKDD 2009, Bled, Slovenia, September 7-11, 2009, Proceedings, Part I}, editor = {Wray L. Buntine and Marko Grobelnik and Dunja Mladenic and John Shawe-Taylor}, volume = {5781}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-642-04179-2}, }