Intelligent Fault Diagnosis With Noisy Labels via Semisupervised Learning on Industrial Time Series

Cheng Cheng, Xiaoyu Liu, Beitong Zhou, Ye Yuan 0002. Intelligent Fault Diagnosis With Noisy Labels via Semisupervised Learning on Industrial Time Series. IEEE Trans. Industrial Informatics, 19(6):7724-7732, June 2023. [doi]

@article{ChengLZY23,
  title = {Intelligent Fault Diagnosis With Noisy Labels via Semisupervised Learning on Industrial Time Series},
  author = {Cheng Cheng and Xiaoyu Liu and Beitong Zhou and Ye Yuan 0002},
  year = {2023},
  month = {June},
  doi = {10.1109/TII.2022.3229130},
  url = {https://doi.org/10.1109/TII.2022.3229130},
  researchr = {https://researchr.org/publication/ChengLZY23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Industrial Informatics},
  volume = {19},
  number = {6},
  pages = {7724-7732},
}