Automatic Yield Management System for Semiconductor Production Test - researchr publication authors

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Huiyuan Cheng, Melanie Po-Leen Ooi, Ye Chow Kuang, Eric Kwang Joo Sim, Bryan Cheah, Serge N. Demidenko. Automatic Yield Management System for Semiconductor Production Test. In Sixth IEEE International Symposium on Electronic Design, Test and Application, DELTA 2011, Queenstown, New Zealand, 17-19 January, 2011. pages 254-258, IEEE, 2011. [doi]

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