Ming-C. Cheng, Feixia Yu, Lin Jun, Min Shen, Goodarz Ahmadi. Steady-state and dynamic thermal models for heat flow analysis of silicon-on-insulator MOSFETs. Microelectronics Reliability, 44(3):381-396, 2004. [doi]
@article{ChengYJSA04,
title = {Steady-state and dynamic thermal models for heat flow analysis of silicon-on-insulator MOSFETs},
author = {Ming-C. Cheng and Feixia Yu and Lin Jun and Min Shen and Goodarz Ahmadi},
year = {2004},
doi = {10.1016/j.microrel.2003.10.019},
url = {http://dx.doi.org/10.1016/j.microrel.2003.10.019},
tags = {analysis, C++, data-flow analysis},
researchr = {https://researchr.org/publication/ChengYJSA04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {3},
pages = {381-396},
}