Sasikumar Cherubal, Abhijit Chatterjee. Test generation based diagnosis of device parameters for analog circuits. In DATE. pages 596-602, 2001. [doi]
@inproceedings{CherubalC01,
title = {Test generation based diagnosis of device parameters for analog circuits},
author = {Sasikumar Cherubal and Abhijit Chatterjee},
year = {2001},
doi = {10.1145/367072.367831},
url = {http://doi.acm.org/10.1145/367072.367831},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/CherubalC01},
cites = {0},
citedby = {0},
pages = {596-602},
booktitle = {DATE},
}