Jiun-Yi Chiang, Jun-Hua Kuo, Ting-Shuo Hsu, Jing-Jia Liou. Chip clustering with mutual information on multiple clock tests and its application to yield tuning. In 32nd IEEE International Conference on Computer Design, ICCD 2014, Seoul, South Korea, October 19-22, 2014. pages 243-248, IEEE, 2014. [doi]
@inproceedings{ChiangKHL14,
title = {Chip clustering with mutual information on multiple clock tests and its application to yield tuning},
author = {Jiun-Yi Chiang and Jun-Hua Kuo and Ting-Shuo Hsu and Jing-Jia Liou},
year = {2014},
doi = {10.1109/ICCD.2014.6974688},
url = {http://dx.doi.org/10.1109/ICCD.2014.6974688},
researchr = {https://researchr.org/publication/ChiangKHL14},
cites = {0},
citedby = {0},
pages = {243-248},
booktitle = {32nd IEEE International Conference on Computer Design, ICCD 2014, Seoul, South Korea, October 19-22, 2014},
publisher = {IEEE},
isbn = {978-1-4799-6492-5},
}