Analysis of Smart Building System: Risks, Threats, and Standards

Ting-Yi Chiang, I-Long Lin, Chi-Jan Huang. Analysis of Smart Building System: Risks, Threats, and Standards. In 6th IEEE International Conference on Knowledge Innovation and Invention, ICKII 2023, Sapporo, Japan, August 11-13, 2023. pages 203-205, IEEE, 2023. [doi]

@inproceedings{ChiangLH23,
  title = {Analysis of Smart Building System: Risks, Threats, and Standards},
  author = {Ting-Yi Chiang and I-Long Lin and Chi-Jan Huang},
  year = {2023},
  doi = {10.1109/ICKII58656.2023.10332639},
  url = {https://doi.org/10.1109/ICKII58656.2023.10332639},
  researchr = {https://researchr.org/publication/ChiangLH23},
  cites = {0},
  citedby = {0},
  pages = {203-205},
  booktitle = {6th IEEE International Conference on Knowledge Innovation and Invention, ICKII 2023, Sapporo, Japan, August 11-13, 2023},
  publisher = {IEEE},
  isbn = {979-8-3503-2353-5},
}