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Analysis of backscatter from chipless metal patch RFID using soft computing techniques

Kyohei Chiba, Goutam Chakraborty, Somnath Mukherjee. Analysis of backscatter from chipless metal patch RFID using soft computing techniques. In The 6th International Conference on Soft Computing and Intelligent Systems (SCIS), and The 13th International Symposium on Advanced Intelligence Systems (ISIS), Kobe, Japan, November 20-24, 2012. pages 971-976, IEEE, 2012. [doi]

Authors

Kyohei Chiba

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Goutam Chakraborty

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Somnath Mukherjee

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