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J. M. Chin, J. C. H. Phang, D. S. H. Chan, M. Palaniappan, G. Gilfeather, C. E. Soh. Single contact optical beam induced currents. Microelectronics Reliability, 41(8):1237-1242, 2001. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Single contact beam induced current phenomenon for microelectronic failure analysisJ. C. H. Phang, D. S. H. Chan, V. K. S. Ong, S. Kolachina, J. M. Chin, M. Palaniappan, G. Gilfeather, Y. X. Seah. mr, 43(9-11):1595-1602, 2003. [doi]
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