Leakage current compensation technique of ESD protection circuit for CMOS operational amplifier

Koken Chin, Hao San, Atsushi Kitajima, Yoshiaki Arai, Jun Yamashita, Hisashi Ito. Leakage current compensation technique of ESD protection circuit for CMOS operational amplifier. In International Symposium on Intelligent Signal Processing and Communication Systems, ISPACS 2016, Phuket, Thailand, October 24-27, 2016. pages 1-4, IEEE, 2016. [doi]

Authors

Koken Chin

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Hao San

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Atsushi Kitajima

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Yoshiaki Arai

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Jun Yamashita

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Hisashi Ito

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