The 2nd competition on counter measures to 2D face spoofing attacks

Ivana Chingovska, J. Yang, Zhen Lei, Dong Yi, Stan Z. Li, O. Kahm, Christian Glaser, N. Darner, Arjan Kuijper, Alexander Nouak, Jukka Komulainen, Tiago F. Pereira, S. Gupta, Shubham Khandelwal, Shubham Bansal, Ayush Rai, Tarun Krishna, Dushyant Goyal, M.-A. Waris, H. Zhang, I. Ahmad, Serkan Kiranyaz, Moncef Gabbouj, Roberto Tronci, Maurizio Pili, Nicola Sirena, Fabio Roli, Javier Galbally, Julian Fiérrez, A. Pinto, Hélio Pedrini, W. S. Schwartz, Anderson Rocha, André Anjos, Sébastien Marcel. The 2nd competition on counter measures to 2D face spoofing attacks. In Julian Fiérrez, Ajay Kumar, Mayank Vatsa, Raymond N. J. Veldhuis, Javier Ortega-Garcia, editors, International Conference on Biometrics, ICB 2013, 4-7 June, 2013, Madrid, Spain. pages 1-6, IEEE, 2013. [doi]

@inproceedings{ChingovskaYLYLKGDKNKPGKBRKGWZAKGTPSRGFPPSRAM13,
  title = {The 2nd competition on counter measures to 2D face spoofing attacks},
  author = {Ivana Chingovska and J. Yang and Zhen Lei and Dong Yi and Stan Z. Li and O. Kahm and Christian Glaser and N. Darner and Arjan Kuijper and Alexander Nouak and Jukka Komulainen and Tiago F. Pereira and S. Gupta and Shubham Khandelwal and Shubham Bansal and Ayush Rai and Tarun Krishna and Dushyant Goyal and M.-A. Waris and H. Zhang and I. Ahmad and Serkan Kiranyaz and Moncef Gabbouj and Roberto Tronci and Maurizio Pili and Nicola Sirena and Fabio Roli and Javier Galbally and Julian Fiérrez and A. Pinto and Hélio Pedrini and W. S. Schwartz and Anderson Rocha and André Anjos and Sébastien Marcel},
  year = {2013},
  doi = {10.1109/ICB.2013.6613026},
  url = {http://dx.doi.org/10.1109/ICB.2013.6613026},
  researchr = {https://researchr.org/publication/ChingovskaYLYLKGDKNKPGKBRKGWZAKGTPSRGFPPSRAM13},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {International Conference on Biometrics, ICB 2013, 4-7 June, 2013, Madrid, Spain},
  editor = {Julian Fiérrez and Ajay Kumar and Mayank Vatsa and Raymond N. J. Veldhuis and Javier Ortega-Garcia},
  publisher = {IEEE},
  isbn = {978-1-4799-0310-8},
}