Intelligent segmentation method for real-time defect inspection system

Yih-Chih Chiou. Intelligent segmentation method for real-time defect inspection system. Computers in Industry, 61(7):646-658, 2010. [doi]

@article{Chiou10,
  title = {Intelligent segmentation method for real-time defect inspection system},
  author = {Yih-Chih Chiou},
  year = {2010},
  doi = {10.1016/j.compind.2010.03.009},
  url = {http://dx.doi.org/10.1016/j.compind.2010.03.009},
  researchr = {https://researchr.org/publication/Chiou10},
  cites = {0},
  citedby = {0},
  journal = {Computers in Industry},
  volume = {61},
  number = {7},
  pages = {646-658},
}