Eli Chiprout. Power delivery dynamics and its impact on silicon validation. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 283, IEEE Computer Society, 2010. [doi]
@inproceedings{Chiprout10-0,
title = {Power delivery dynamics and its impact on silicon validation},
author = {Eli Chiprout},
year = {2010},
doi = {10.1109/VTS.2010.5469552},
url = {http://dx.doi.org/10.1109/VTS.2010.5469552},
researchr = {https://researchr.org/publication/Chiprout10-0},
cites = {0},
citedby = {0},
pages = {283},
booktitle = {28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-6648-1},
}