Mang Tik Chiu, Xingqian Xu, Kai Wang, Jennifer Hobbs, Naira Hovakimyan, Thomas S. Huang, Honghui Shi, Yunchao Wei, Zilong Huang, Alexander G. Schwing, Robert Brunner, Ivan Dozier, Wyatt Dozier, Karen Ghandilyan, David Wilson, Hyunseong Park, Jun-hee Kim, Sungho Kim, Qinghui Liu, Michael C. Kampffmeyer, Robert Jenssen, Arnt-Børre Salberg, Alexandre Barbosa, Rodrigo G. Trevisan, Bingchen Zhao, Shaozuo Yu, Siwei Yang, Yin Wang, Hao Sheng, Xiao Chen, Jingyi Su, Ram Rajagopal, Andrew Y. Ng, Van Thong Huynh, Soo-Hyung Kim, In Seop Na, Ujjwal Baid, Shubham Innani, Prasad Dutande, Bhakti Baheti, Sanjay N. Talbar, Jianyu Tang. The 1st Agriculture-Vision Challenge: Methods and Results. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 212-218, IEEE, 2020. [doi]
@inproceedings{ChiuXWHHHSWHSBD20,
title = {The 1st Agriculture-Vision Challenge: Methods and Results},
author = {Mang Tik Chiu and Xingqian Xu and Kai Wang and Jennifer Hobbs and Naira Hovakimyan and Thomas S. Huang and Honghui Shi and Yunchao Wei and Zilong Huang and Alexander G. Schwing and Robert Brunner and Ivan Dozier and Wyatt Dozier and Karen Ghandilyan and David Wilson and Hyunseong Park and Jun-hee Kim and Sungho Kim and Qinghui Liu and Michael C. Kampffmeyer and Robert Jenssen and Arnt-Børre Salberg and Alexandre Barbosa and Rodrigo G. Trevisan and Bingchen Zhao and Shaozuo Yu and Siwei Yang and Yin Wang and Hao Sheng and Xiao Chen and Jingyi Su and Ram Rajagopal and Andrew Y. Ng and Van Thong Huynh and Soo-Hyung Kim and In Seop Na and Ujjwal Baid and Shubham Innani and Prasad Dutande and Bhakti Baheti and Sanjay N. Talbar and Jianyu Tang},
year = {2020},
doi = {10.1109/CVPRW50498.2020.00032},
url = {https://doi.org/10.1109/CVPRW50498.2020.00032},
researchr = {https://researchr.org/publication/ChiuXWHHHSWHSBD20},
cites = {0},
citedby = {0},
pages = {212-218},
booktitle = {2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9360-1},
}