Surface Plasmon Resonance Based Measurement of the Dielectric Function of a Thin Metal Film

Radek Chlebus, Jakub Chylek, Dalibor Ciprian, Petr Hlubina. Surface Plasmon Resonance Based Measurement of the Dielectric Function of a Thin Metal Film. Sensors, 18(11):3693, 2018. [doi]

@article{ChlebusCCH18,
  title = {Surface Plasmon Resonance Based Measurement of the Dielectric Function of a Thin Metal Film},
  author = {Radek Chlebus and Jakub Chylek and Dalibor Ciprian and Petr Hlubina},
  year = {2018},
  doi = {10.3390/s18113693},
  url = {https://doi.org/10.3390/s18113693},
  researchr = {https://researchr.org/publication/ChlebusCCH18},
  cites = {0},
  citedby = {0},
  journal = {Sensors},
  volume = {18},
  number = {11},
  pages = {3693},
}