Jung-Hoon Cho, Soo-Il Choi. PCI-Express Gen4.0 based Portable SSD Test System. In International Conference on Electronics, Information, and Communication, ICEIC 2019, Auckland, New Zealand, January 22-25, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{ChoC19-3,
title = {PCI-Express Gen4.0 based Portable SSD Test System},
author = {Jung-Hoon Cho and Soo-Il Choi},
year = {2019},
doi = {10.23919/ELINFOCOM.2019.8706429},
url = {https://doi.org/10.23919/ELINFOCOM.2019.8706429},
researchr = {https://researchr.org/publication/ChoC19-3},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {International Conference on Electronics, Information, and Communication, ICEIC 2019, Auckland, New Zealand, January 22-25, 2019},
publisher = {IEEE},
isbn = {978-89-950044-4-9},
}