Chihyun Cho, Joo-Gwang Lee, Jeong Hwan Kim, Dae-Chan Kim. Uncertainty Analysis in EVM Measurement Using a Monte Carlo Simulation. IEEE T. Instrumentation and Measurement, 64(6):1413-1418, 2015. [doi]
@article{ChoLKK15,
title = {Uncertainty Analysis in EVM Measurement Using a Monte Carlo Simulation},
author = {Chihyun Cho and Joo-Gwang Lee and Jeong Hwan Kim and Dae-Chan Kim},
year = {2015},
doi = {10.1109/TIM.2015.2406058},
url = {http://dx.doi.org/10.1109/TIM.2015.2406058},
researchr = {https://researchr.org/publication/ChoLKK15},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {64},
number = {6},
pages = {1413-1418},
}