PEAKASO: Peak-Temperature Aware Scan-Vector Optimization

Minsik Cho, David Z. Pan. PEAKASO: Peak-Temperature Aware Scan-Vector Optimization. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 52-57, IEEE Computer Society, 2006. [doi]

Authors

Minsik Cho

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David Z. Pan

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