Machine-Learning-Based Read Reference Voltage Estimation for NAND Flash Memory Systems Without Knowledge of Retention Time

Hyemin Choe, Jeongju Jee, Seung Chan Lim, Sung-Min Joe, Il Han Park, Hyuncheol Park. Machine-Learning-Based Read Reference Voltage Estimation for NAND Flash Memory Systems Without Knowledge of Retention Time. IEEE Access, 8:176416-176429, 2020. [doi]

@article{ChoeJLJPP20,
  title = {Machine-Learning-Based Read Reference Voltage Estimation for NAND Flash Memory Systems Without Knowledge of Retention Time},
  author = {Hyemin Choe and Jeongju Jee and Seung Chan Lim and Sung-Min Joe and Il Han Park and Hyuncheol Park},
  year = {2020},
  doi = {10.1109/ACCESS.2020.3026232},
  url = {https://doi.org/10.1109/ACCESS.2020.3026232},
  researchr = {https://researchr.org/publication/ChoeJLJPP20},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {8},
  pages = {176416-176429},
}