Hyun Choi, Abhijit Chatterjee. Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent Sub-sampling. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 9-14, IEEE Computer Society, 2010. [doi]
@inproceedings{ChoiC10-4,
title = {Jitter Characterization of Pseudo-random Bit Sequences Using Incoherent Sub-sampling},
author = {Hyun Choi and Abhijit Chatterjee},
year = {2010},
doi = {10.1109/ATS.2010.11},
url = {http://dx.doi.org/10.1109/ATS.2010.11},
researchr = {https://researchr.org/publication/ChoiC10-4},
cites = {0},
citedby = {0},
pages = {9-14},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}