Jiwon Choi, Changick Kim. Unsupervised detection of surface defects: A two-step approach. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 1037-1040, IEEE, 2012. [doi]
@inproceedings{ChoiK12-7,
title = {Unsupervised detection of surface defects: A two-step approach},
author = {Jiwon Choi and Changick Kim},
year = {2012},
doi = {10.1109/ICIP.2012.6467040},
url = {http://dx.doi.org/10.1109/ICIP.2012.6467040},
researchr = {https://researchr.org/publication/ChoiK12-7},
cites = {0},
citedby = {0},
pages = {1037-1040},
booktitle = {19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2534-9},
}