Yeon Joon Choi, Min-Hwi Kim, Suhyun Bang, Tae-Hyeon Kim, Dong Keun Lee, Kyungho Hong, Chae-Soo Kim, Sungjun Kim, Seongjae Cho, Byung-Gook Park. x/TiN RRAM and Its Effect on Filament Formation Modeled by Monte Carlo Simulation. IEEE Access, 8:228720-228730, 2020. [doi]
@article{ChoiKBKLHKKCP20,
title = {x/TiN RRAM and Its Effect on Filament Formation Modeled by Monte Carlo Simulation},
author = {Yeon Joon Choi and Min-Hwi Kim and Suhyun Bang and Tae-Hyeon Kim and Dong Keun Lee and Kyungho Hong and Chae-Soo Kim and Sungjun Kim and Seongjae Cho and Byung-Gook Park},
year = {2020},
doi = {10.1109/ACCESS.2020.3046300},
url = {https://doi.org/10.1109/ACCESS.2020.3046300},
researchr = {https://researchr.org/publication/ChoiKBKLHKKCP20},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {8},
pages = {228720-228730},
}