Eun-Ho Choi, Seong-Mun Kim, Kyoungmin Park, Sanghyun Heo, Hyunggun Ma, Gyeongho Namgoong, Haksun Kim, Franklin Bien. A 32-dB SNR Readout IC With 20-Vpp Tx Using On-Chip DM-TISM in HV BCD Process for Mutual-Capacitive Fingerprint Sensor. IEEE Trans. on Circuits and Systems, 67-II(7):1224-1228, 2020. [doi]
@article{ChoiKPHMNKB20,
title = {A 32-dB SNR Readout IC With 20-Vpp Tx Using On-Chip DM-TISM in HV BCD Process for Mutual-Capacitive Fingerprint Sensor},
author = {Eun-Ho Choi and Seong-Mun Kim and Kyoungmin Park and Sanghyun Heo and Hyunggun Ma and Gyeongho Namgoong and Haksun Kim and Franklin Bien},
year = {2020},
doi = {10.1109/TCSII.2019.2937541},
url = {https://doi.org/10.1109/TCSII.2019.2937541},
researchr = {https://researchr.org/publication/ChoiKPHMNKB20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {67-II},
number = {7},
pages = {1224-1228},
}