Noise Analysis under Capacitive and Inductive Coupling for High Speed Circuits

Seung Hoon Choi, Kaushik Roy. Noise Analysis under Capacitive and Inductive Coupling for High Speed Circuits. In 1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand. pages 365-369, IEEE Computer Society, 2002. [doi]

@inproceedings{ChoiR02,
  title = {Noise Analysis under Capacitive and Inductive Coupling for High Speed Circuits},
  author = {Seung Hoon Choi and Kaushik Roy},
  year = {2002},
  url = {http://csdl.computer.org/comp/proceedings/delta/2002/1453/00/14530365abs.htm},
  tags = {analysis},
  researchr = {https://researchr.org/publication/ChoiR02},
  cites = {0},
  citedby = {0},
  pages = {365-369},
  booktitle = {1st IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2002), 29-31 January 2002, Christchurch, New Zealand},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-1453-7},
}