Data Mining Analysis of Turn around Time Variation in a Semiconductor Manufacturing Line - researchr publication authors

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Il-Gyo Chong, Chenbo Zhu, Yanfeng Wu. Data Mining Analysis of Turn around Time Variation in a Semiconductor Manufacturing Line. In Begoña Vitoriano, Greg H. Parlier, editors, ICORES 2015 - Proceedings of the International Conference on Operations Research and Enterprise Systems, Lisbon, Portugal, 10-12 January, 2015. pages 185-189, SciTePress, 2015.

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