Florian Chouard, Shailesh More, Michael Fulde, Doris Schmitt-Landsiedel. An analog perspective on device reliability in 32nm high-κ metal gate technology. In Rolf Kraemer, Adam Pawlak, Andreas Steininger, Mario Schölzel, Jaan Raik, Heinrich Theodor Vierhaus, editors, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011. pages 65-70, IEEE, 2011. [doi]
@inproceedings{ChouardMFS11, title = {An analog perspective on device reliability in 32nm high-κ metal gate technology}, author = {Florian Chouard and Shailesh More and Michael Fulde and Doris Schmitt-Landsiedel}, year = {2011}, doi = {10.1109/DDECS.2011.5783049}, url = {http://dx.doi.org/10.1109/DDECS.2011.5783049}, researchr = {https://researchr.org/publication/ChouardMFS11}, cites = {0}, citedby = {0}, pages = {65-70}, booktitle = {14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2011, Cottbus, Germany, April 13-15, 2011}, editor = {Rolf Kraemer and Adam Pawlak and Andreas Steininger and Mario Schölzel and Jaan Raik and Heinrich Theodor Vierhaus}, publisher = {IEEE}, isbn = {978-1-4244-9755-3}, }