Efficient detection of thread safety violations via coverage-guided generation of concurrent tests

Ankit Choudhary, Shan Lu, Michael Pradel. Efficient detection of thread safety violations via coverage-guided generation of concurrent tests. In Sebastián Uchitel, Alessandro Orso, Martin P. Robillard, editors, Proceedings of the 39th International Conference on Software Engineering, ICSE 2017, Buenos Aires, Argentina, May 20-28, 2017. pages 266-277, IEEE / ACM, 2017. [doi]

@inproceedings{ChoudharyLP17,
  title = {Efficient detection of thread safety violations via coverage-guided generation of concurrent tests},
  author = {Ankit Choudhary and Shan Lu and Michael Pradel},
  year = {2017},
  url = {http://dl.acm.org/citation.cfm?id=3097401},
  researchr = {https://researchr.org/publication/ChoudharyLP17},
  cites = {0},
  citedby = {0},
  pages = {266-277},
  booktitle = {Proceedings of the 39th International Conference on Software Engineering, ICSE 2017, Buenos Aires, Argentina, May 20-28, 2017},
  editor = {Sebastián Uchitel and Alessandro Orso and Martin P. Robillard},
  publisher = {IEEE / ACM},
  isbn = {978-1-5386-3868-2},
}