Tommy W. S. Chow, Hong-Zhou Tan. HOS-based nonparametric and parametric methodologies for machine fault detection. IEEE Transactions on Industrial Electronics, 47(5):1051-1059, 2000. [doi]
@article{ChowT00,
title = {HOS-based nonparametric and parametric methodologies for machine fault detection},
author = {Tommy W. S. Chow and Hong-Zhou Tan},
year = {2000},
doi = {10.1109/41.873213},
url = {http://dx.doi.org/10.1109/41.873213},
researchr = {https://researchr.org/publication/ChowT00},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {47},
number = {5},
pages = {1051-1059},
}