Fahmida N. Chowdhury, Bin Jiang 0001. A new technique for fast detection of progressive faults. In Proceedings of the 2004 American Control Conference, ACC 2004, Boston, MA, USA, June 30 - July 2, 2004. pages 5058-5063, IEEE, 2004. [doi]
@inproceedings{ChowdhuryJ04-0,
title = {A new technique for fast detection of progressive faults},
author = {Fahmida N. Chowdhury and Bin Jiang 0001},
year = {2004},
doi = {10.23919/ACC.2004.1384652},
url = {https://doi.org/10.23919/ACC.2004.1384652},
researchr = {https://researchr.org/publication/ChowdhuryJ04-0},
cites = {0},
citedby = {0},
pages = {5058-5063},
booktitle = {Proceedings of the 2004 American Control Conference, ACC 2004, Boston, MA, USA, June 30 - July 2, 2004},
publisher = {IEEE},
isbn = {0-7803-8335-4},
}