A novel blind image quality assessment metric and its feature selection strategy

Ying Chu, Xuanqin Mou, Wei Hong, Zhen Ji. A novel blind image quality assessment metric and its feature selection strategy. In Nitin Sampat, Sebastiano Battiato, editors, Digital Photography IX, part of the IS&T-SPIE Electronic Imaging Symposium, Burlingame, California, USA, February 3, 2013, Proceedings. Volume 8660 of SPIE Proceedings, SPIE/IS&T, 2013. [doi]